Conferences

[23rd International Microprocesses and Nanotechnology Conference] Characterization of new charge trapping nonvolatile memory device using gate injection switching

2010
작성자
김나현
작성일
2010-11-12 10:10
조회
172

Nov 09~12, 2010

23rd International Microprocesses and Nanotechnology Conference, Japan

[poster]

Characterization of new charge trapping nonvolatile memory device using gate injection switching

Yu jeong Seo, Ho Myoung An, Hee Dong Kim, In Rok Hwang, Sa Hwan Hong, Bae Ho Park and Tae Geun Kim*

전체 0

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