Papers

Fabrication of Standard Calibration Samples for Highly Reliable Atomic Force Microscope Measurements (IF 1.134 ; JCR 77.119%)

2017
작성자
유경종
작성일
2017-05-24 19:08
조회
160
저널명 : Journal of Nanoscience and Nanotechnology, 17(10) 7783-7787 (2017, OCT)
논문 저자
Tae Hoon Park, Ju Hyun Park, Dong Su Jeon, Yong Gyun Kim, Chi Hong Min, Jae Heung Yu and Tae Geun Kim* 
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