Papers

Vacancy-modulated self-rectifying characteristics of NiOx/Al2O3-based nanoscale ReRAM devices / Journal of Alloys & Compounds (IF 4.175; JCR 7.237%)

2020
작성자
shhong
작성일
2020-05-11 20:00
조회
228
저널명 : Journal of Alloys and Compounds, 821 153247 (2020, APR)
논문 저자
Ji Hwan Lee, Ju Hyun Park, Tukaram D. Dongale, and Tae Geun Kim* 
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