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Introduction
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High-efficiency and high-reliability deep-UV light-emitting diodes using transparent Ni-implanted AlN ohmic electrodes / IEEE Access (IF 3.367 ; JCR 34.25%)
2021
작성자
thlee12
작성일
2021-12-15 13:17
조회
246
저널명 : IEEE Access 9, 166617-166623 (2021 DEC)
논문 저자
Tae Hoon Park,
Kyung Rock Son, Hideki Hirayama, and
Tae Geun Kim*
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0
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0
인쇄
High-efficiency-and-high-reliability-deep-UV-light-emitting-diodes-using-transparent-Ni-implanted-AlN-ohmic-electrodes.pdf
«
Haze-Enhanced ZnO/Ag/ZnO Nanomesh Electrode for Flexible, High-Efficiency Indoor Organic Photovoltaics / Journal of Power Sources (IF 9.127 ; JCR 10.96%)
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