Papers

High-efficiency and high-reliability deep-UV light-emitting diodes using transparent Ni-implanted AlN ohmic electrodes / IEEE Access (IF 3.367 ; JCR 34.25%)

2021
작성자
thlee12
작성일
2021-12-15 13:17
조회
247
저널명 :  IEEE Access 9, 166617-166623 (2021 DEC)


논문 저자
Tae Hoon Park, Kyung Rock Son, Hideki Hirayama, and Tae Geun Kim*
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